LCZ Measuarment

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UV-VIS-NIR Detector Characterization System
10 Channel I-V-T
Visible NIR filter wheel
Noise analyzer software
x-z-θ Stage controler
Digital Thickness Meter
8-channel multiplexer
LCZ Measuarment
Spectrometer data collecting
Action Spectrum Software
Solar Cell IV

 

Mott-Scottky Plot.

Purpose: To determine band position of the semiconductor sample.



Block diagram of the Mott-Scottky plot setup.


Mott-Scottky plot control pannelgraph display window


 Mott-Scottky plot graph display window

Main features:
        Draw the Mott-Scottky plot.
        Automatically fit linear regression line to data points.


Impedance Measurement Setup.

Purpose: To analyze the change conductivity of the semiconductor layer with time, under the room and controlled atmospheric conditions.



Impedance measurement setup block diagram


User interface parameter setting window of the software.


Graphs display screen

Main features:
Can be used to plot following graphs
        Impedance vs. time
        Phase angle vs. time
        Effective resistance vs. time
        Effective reactance vs. time
        Dissipation factor vs. time
Can be used to plot above graphs at various test frequencies.

 

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This site was last updated 12/28/08